Overview

Date: Wednesday, December 9, 2020
Time: 1:00 p.m.-5:00 p.m. EDT
Surfaces play an important role in almost all aspects of our lives. Understanding and controlling surfaces and surface interactions can be critical to the success of many biomaterials including biosensors, bioimplants, and drug delivery constructs. It is critical to know as much as possible about a surface in order to both understand the interactions that occur and to be able to design surfaces that promote successful interactions. X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) are two powerful surface analytical methods that have been proven to provide valuable, quantitative and spatial (mapping) information about both biomaterial surfaces as well as biological surfaces/interfaces. In order to maximize the information gained from these methods, it is important to not only understand how the tools work, but also how to properly handle and prepare samples and how to optimize an experimental plan.

Webinar Objectives/Topics

  • Sample handling and preparation when working with UHV equipment
  • How to avoid common surface contaminants
  • Experimental design (How to optimize samples, what controls to include, how to conserve time and money)
  • Can you analyze this? (How to mount and analyze non-standard and challenging samples)
  • XPS background, instrumentation and data collection (Examples from real world samples and how to analyze the data)
  • ToF-SIMS background, instrumentation and data collection (Examples from real world samples and how to analyze the data)

Presenters

Lara J. Gamble, Research Associate Professor
NESAC/BIO, Dept of Bioengineering
University of Washington

Dan J. Graham, Senior Research Scientist
NESAC/BIO, Dept of Bioengineering
University of Washington

Who Should Attend

This webinar is intended for researchers, students, technologists and others involved in research with biomaterial and biological surfaces who are looking to gain an understanding or broaden their knowledge on how XPS and ToF-SIMS can help in characterizing biological and biomaterial surfaces and interactions. The course will be beneficial to a large audience, from young scientists to engineers, as various aspects from instrumentation through best practices for sample handling, data collection and data analysis will be discussed in the context of characterizing organic materials with XPS and ToF-SIMS.

Webinar Cost

Cost:

Platform: Zoom

Times listed are Eastern Daylight Time (EDT)Check your timezone accordingly!

Each webinar includes a link to a pdf file of the copyrighted webinar notes. During the webinar you may ask questions. Presenters will review and answer them periodically throughout the presentation. 

You must be present the day of the webinar, recorded versions will not be available.

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Other AVS Events

AVS 2020 Short Course, Webinar and e-Talk Schedule

AVS 2020 Short Course programs (Chapter, National, Webinars, and e-Talks) will be posted on the AVS Short Schedule page as they become available. Please bookmark the webpage to view upcoming training opportunities.

 

AVS Mid-Atlantic Chapter Online Short Course Program
Atomic Layer Etching

November 11, 2020
10:00 a.m. - 5:00 p.m. EDT
Instructor: Steve George
REGISTER HERE!

AVS Online Short Course Training - Fall 2020
Controlling Contamination in Vacuum Systems

November 16, 2020
10:00 a.m. - 5:00 p.m. EDT
Instructor: Tim Gessert
REGISTER HERE!

Vacuum System Leak Detection and Basic Troubleshooting
November 18, 2020
10:00 a.m. - 5:00 p.m. EDT
Instructor: Neil Peacock
REGISTER HERE!

Plasma-Enhanced CVD: Fundamentals, Techniques and Applications
November 19, 2020
10:00 a.m. - 5:00 p.m. EDT
Instructor: Robert Grubbs
REGISTER HERE!

AVS Webinar: Characterization of Thin Film Systems for Flexible Applications
November 3, 2020
1:00 p.m. - 5:00 p.m. EDT
Instructors: Megan Cordill and Christian Mitterer
REGISTER HERE!

AVS Webinar: Recent Developments in Materials Processing and Integration for MRAM
January 26, 2021
1:00 p.m. - 5:00 p.m. EDT
Instructors: Matthias Gottwald and Michael Rizzolo
REGISTRATION COMING SOON!

AVS Webinar: Plasma-Assisted Atomic Layer Deposition: From Basics to Applications
February 10, 2021
1:00 p.m. - 5:00 p.m. EDT
Instructor: Erwin Kessels
REGISTRATION COMING SOON!

AVS Courses by Request
If you are interested in seeing an AVS Short Course offered in 2021 please complete the AVS Courses by Request form.

AVS Onsite/Online Training

Do your employees need training now? Are budgets tight? Let AVS bring our short courses and qualified instructors to your organization during these tough economic times via Zoom. Please complete the AVS Onsite/Online Training request form to receive a proposal.