Date: Wednesday, December 9, 2020
Time: 1:00 p.m.-5:00 p.m. EST
Surfaces play an important role in almost all aspects of our lives. Understanding and controlling surfaces and surface interactions can be critical to the success of many biomaterials including biosensors, bioimplants, and drug delivery constructs. It is critical to know as much as possible about a surface in order to both understand the interactions that occur and to be able to design surfaces that promote successful interactions. X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) are two powerful surface analytical methods that have been proven to provide valuable, quantitative and spatial (mapping) information about both biomaterial surfaces as well as biological surfaces/interfaces. In order to maximize the information gained from these methods, it is important to not only understand how the tools work, but also how to properly handle and prepare samples and how to optimize an experimental plan.

Webinar Objectives/Topics

  • Sample handling and preparation when working with UHV equipment
  • How to avoid common surface contaminants
  • Experimental design (How to optimize samples, what controls to include, how to conserve time and money)
  • Can you analyze this? (How to mount and analyze non-standard and challenging samples)
  • XPS background, instrumentation and data collection (Examples from real world samples and how to analyze the data)
  • ToF-SIMS background, instrumentation and data collection (Examples from real world samples and how to analyze the data)


Lara J. Gamble, Research Associate Professor
NESAC/BIO, Dept of Bioengineering
University of Washington

Dan J. Graham, Senior Research Scientist
NESAC/BIO, Dept of Bioengineering
University of Washington

Who Should Attend

This webinar is intended for researchers, students, technologists and others involved in research with biomaterial and biological surfaces who are looking to gain an understanding or broaden their knowledge on how XPS and ToF-SIMS can help in characterizing biological and biomaterial surfaces and interactions. The course will be beneficial to a large audience, from young scientists to engineers, as various aspects from instrumentation through best practices for sample handling, data collection and data analysis will be discussed in the context of characterizing organic materials with XPS and ToF-SIMS.

Webinar Cost


Platform: Zoom

Times listed are Eastern Standard Time (EST)Check your timezone accordingly!

Each webinar includes a link to a pdf file of the copyrighted webinar notes. During the webinar you may ask questions. Presenters will review and answer them periodically throughout the presentation. 

You must be present the day of the webinar, recorded versions will not be available.

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Other AVS Events

AVS 2020 Short Course, Webinar and e-Talk Schedule

AVS 2020 Short Course programs (Chapter, National, Webinars, and e-Talks) will be posted on the AVS Short Schedule page as they become available. Please bookmark the webpage to view upcoming training opportunities.

AVS Online Short Course Training - February 2021
Plasma Etching and RIE: Fundamentals and Applications

February 23, 2021
10:00 a.m. - 5:00 p.m. EST
Instructor: Randy Shul

Vacuum Pumps
February 24, 2021
10:00 a.m. - 5:00 p.m. EST
Instructor: Tim Gessert

Sputter Deposition
February 26, 2021
10:00 a.m. - 5:00 p.m. EST
Instructor: Angus Rockett

AVS Webinar: Recent Developments in Materials Processing and Integration for MRAM
January 26, 2021
1:00 p.m. - 5:00 p.m. EST
Instructors: Matthias Gottwald and Michael Rizzolo

AVS Webinar: Plasma-Assisted Atomic Layer Deposition: From Basics to Applications
February 10, 2021
1:00 p.m. - 5:00 p.m. EST
Instructor: Erwin Kessels

AVS Webinar: Characterization of Thin Film Systems for Flexible Applications
March 2, 2021
1:00 p.m. - 5:00 p.m. EST
Instructors: Megan Cordill and Christian Mitterer

AVS Webinar: Gallium Oxide Materials and Devices
April 8, 2021
1:00 p.m.-5:00 p.m. EST
Instructor: Sriram Krishnamoorthy
Registration Available Soon!

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