- Comparison of Ion Sources for FIB Instruments
- Ion-Solid Interactions, Ion Imaging, Ion Implantation Damage
- 2D Sectioning and 3D FIB SEM Tomography
- Ion Patterning, Delayering, and FIB Milling for Micromechanical Testing
- S/TEM and APT Specimen Preparation
- $200 (AVS Platinum Member)
- $250 (Non-Member or AVS Gold/Silver Member)
- $50 (Full-time Student/Requires Student I.D.)
Times listed are Eastern Daylight Time (EDT). Check your timezone accordingly!
Each webinar includes a link to a pdf file of the copyrighted webinar notes. During the webinar you may ask questions. Presenters will review and answer them periodically throughout the presentation.
You must be present the day of the webinar, recorded versions will not be available.
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Other AVS Events
AVS Southern California Chapter Short Course Program (IN PERSON)
September 27-29, 2021
Holiday Inn Buena Park
Buena Park, CA
AVS Courses by Request
If you are interested in seeing an AVS Short Course offered in 2021 please complete the AVS Courses by Request form.
Do your employees need training now? Are budgets tight? Let AVS bring our short courses and qualified instructors to your organization during these tough economic times via Zoom. Please complete the AVS Onsite/Online Training request form to receive a proposal.