Event Date: April 19, 2023
Time: 1:00 p.m.-2:00 p.m. ET, Check your time zone!
Pre-Registration Required by April 17, 2023

The top few nanometers of a sample is defined as the surface. The surface is where most chemical reactions take place. There are many instances where the surface of materials are designed/functionalized in order to optimize properties and improve device performance; there are other instances where the surface becomes compromised and the material/device performance degrades. Auger Electron Spectroscopy (AES), X-ray Photoelectron Spectroscopy (XPS), and Time of Flight Secondary Ion Mass Spectrometry (ToF-SIMS) are the three most common, and commercially available, surface analysis techniques. These techniques provide complimentary information regarding the composition/microstructure of the surface and sub-surface region of a sample. In this presentation, I will introduce AES, XPS, and ToF-SIMS, show typical data, and discuss how the data helped understand mechanisms and/or resolve material problems.  I will also introduce techniques which we do not have in-house,but have access to via external collaborations.

Who Should Attend

e-Talks are an online forum to learn about the latest trends in the core technical areas of the AVS. All AVS e-Talks are geared toward a general technical audience, including academic and industrial researchers, technologists, policy-makers, and the public.


Vincent S. Smentkowski
Senior Scientist
GE Vernova Advanced Research Center


Vincent (Vin, Vince) S. Smentkowski is a Senior Scientist at the GE Vernova Advanced Research Center where he performs surface analysis to support programs at the Vernova Research Center, the Vernova businesses, and strategic partners. His research is focused on the applications of ToF-SIMS analysis, emphasizing how multivariate statistical analysis tools facilitate data reduction; he also collaborates with external laboratories to evaluate advanced microstructural characterization techniques such as Atom Probe Tomography and Helium Ion Microscopy and show the benefits these techniques have for industrial materials. Dr. Smentkowski holds 7 U.S. patents, more than 100 publications in referred journals, more than 280 formal GE internal manuscripts, numerous contributed, invited and keynote talks. He has co-authored 3 book chapters and edited one book “Surface Analysis and Techniques in Biology” (Springer, 2014). In 2011, Dr. Smentkowski served as the first Guest Editor for a Special Issue of Microscopy Today focused on Surface Analysis. He is a 2010 Fellow of the American Vacuum Society (AVS) and a 2021 Fellow of the Microanalysis Society (MAS); he was also a recipient of the AVS Excellence in Leadership Recognition Award in 2015. Dr. Smentkowski has served many roles within AVS.
LinkedIn: https://www.linkedin.com/in/vincentsmentkowski/

Twitter: @VinSmentkowski

Have an Idea for an e-Talk or Webinar?

We welcome suggestions for future Webinars and/or e-Talk topics and speakers.

Please e-mail e-Talk suggestions to Matthew Jordan, AVS e-Talk Chair, matt_jordan@avs.org.

Please e-mail Webinar suggestions to David Adams, AVS Short Course Chair, david_adams@avs.org.

NEW! AVS Online Training Sponsorship Opportunities Available

Would your company like to sponsor an upcoming AVS Short Course Program (public programs only), Webinar, and/or e-Talk? AVS Online Training has new sponsorship opportunities available.

Other AVS Events

More Coming Soon! Stay tuned.

AVS National Online Short Course Program (Spring 2023)
March 13-24, 2023
Platform: Zoom

  • Cleaning and Surface Conditioning Techniques for Integrated Circuit Manufacturing (2 days) (3/13-14/23)
  • Atomic Layer Etching (3/15/23)
  • Sputter Deposition (3/16/23)
  • Ultra-high Vacuum Design and Practices (3/17/23)
  • Vacuum Pumps: An introduction to their operation and maintenance (3/20/23)
  • Plasma Etching and RIE: Fundamentals and Applications (2 days) (3/21-22/23)
  • Essentials of Accurate and Reliable Surface Analysis using X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) (3/23/23)
  • Partial Pressure Analysis with Residual Gas Analyzers (3/24/23)


AVS New Mexico Chapter Short Course Program (IN PERSON)
Albuquerque, NM
May 22-25, 2023

  • Basic Vacuum Technology (4 days) (5/22-25/23)
  • Basics of Radio Frequency Technology (5/22/23)
  • Improving the Efficiency of Vacuum Processes (5/22/23)
  • Vacuum and Cryogen Safety (5/24/23)
  • Plasma and Ion Beam Diagnostics: Principles and Applications  (5/25/23)


ICMCTF 2023 Short Course Program
Town & Country Resort Hotel and Convention Center
San Diego, CA
May 21-25, 2023

  • Plasma Basics (5/21/23)
  • Physics of Plasmas use in Deposition Processes (5/22/23)
  • Fundamentals of Sputter Deposition (5/22/23)
  • Control of Micro- and Nanostructure Evolution during Physcal Vapor Deposition (5/23/23)
  • Fundamentals of HiPIMS Plasmas for Thin Film Deposition (5/23/23)
  • Advanced Understanding of HiPIMS Plasmas for Thin Film Deposition (5/24/23)
  • Practical Thin Film Characterization - An Introduction (5/24/23)
  • Thin Film Characterization by X-ray Photoelectron Spectroscopy (5/25/23)


AVS Courses by Request 
If you are interested in seeing an AVS Short Course offered in 2023 please complete the AVS Courses by Request form. (Recommended for individual training)

AVS Onsite/Online Training
Do your employees need training now? Are budgets tight? Let AVS bring our short courses and qualified instructors to your organization during these tough economic times via Zoom. Please complete the AVS Onsite/Online Training request form to receive a proposal. (Recommended for group training)

Mass-production of 2D Electronic Medical Diagnostics for Home Use
June 7, 2023
1:00 PM - 2:00 PM
Instructor(s): Christopher Muratore

Registration Coming Soon!

Have an Idea for an AVS e-Talk?

Matthew Jordan
AVS e-Talk Chair

Have an Idear for an AVS Webinar?

David Adams
AVS Short Course Comittee Chair