Date: Wednesday, June 10, 2020
Time: 1:00 p.m.-5:00 p.m. EDT
This webinar will review the basic principles of X-ray Photoelectron Spectroscopy (XPS) as needed to appreciate two new important advancements – Hard X-ray Photoelectron Spectroscopy (HAXPES) and near-ambient pressure XPS (NAP-XPS). In the case of HAXPES, advancements in higher energy X-ray sources now allow small laboratory systems to be used for analysis that historically only has been done on synchrotron beamlines. Similarly, NAP-XPS allows the historically ultra-high-vacuum XPS method to be applied to realistic conditions that are important to many functional materials, such as gaseous or liquid atmospheres. The webinar will present instrumentation and applications of the HAXPES and NAP-XPS methods, as well as discuss limitations and challenges of these rapidly advancing techniques.

Who Should Attend

Laboratory managers, scientists, engineers, technicians, and students who desire an understanding of current XPS technologies at the forefront of their development. Many users of XPS will benefit from the course – from novices who are new to the field of surface analysis to advanced users who would like to broaden their knowledge of new developments in XPS instrumentation and applications.

Save with AVS Membership

Save $50 per AVS Webinar with an AVS Platinum Membership. The savings from just two webinars is equivalent to the price of an AVS Platinum Membership, which provides discounts on conferences/short courses as well as access to the AVS publications and technical libraries, career services, and more. Don’t miss out on these savings. Contact Angela Klink, AVS Membership Administrator, angela@avs.org, for your discount code or to upgrade to Platinum.


Kateryna Artyushkova
Senior Staff Scientist, Physical Electronics

Webinar Objectives

Provide a detailed description of recent advances of XPS instrumentation, including the development of Hard X-ray sources and near-ambient pressure X-ray photoelectron spectroscopy. The webinar will discuss HAXPES and NAP-XPS instrumentation and present applications using both techniques

  • Essential principles of a major surface analytical method – XPS
  • Recent development of Hard X-ray sources for extending depth of analysis
  • Different types of HAXPES instruments and their advantages/weaknesses
  • Multiple applications of HAXPES in an analysis of interfaces
  • Technology and applications of Near-Ambient Pressure XPS
  • Different types of NAP-XPS instruments and their advantages/weaknesses
  • Limitations and challenges in HAXPES and NAP-XPS

Other AVS Events

AVS 2020 Short Course programs (Chapter, National, and Webinars) will be posted on the AVS Short Schedule page as they become available. Please bookmark the webpage to view upcoming training opportunities.

AVS e-Talk: Nanoscale Tomographic Mapping of
Hydrated Materials with Cryo-APT

May 14, 2020
Register Here!


AVS Online Short Courses
Atomic Layer Etching
, May 19, 2020
Sputter Deposition, May 21, 2020
Register Here!

AVS 67 National Short Course Program
Denver, CO
October 25-30, 2020
AVS Courses by Request
If you are interested in seeing an AVS Short Course offered in 2020 please complete the AVS Courses by Request form.
AVS Onsite Training
Do your employees need training now? Is travel out of the question? Are budgets tight? Let AVS bring our short courses and qualified instructors to your organization during these tough economic times. Please complete the AVS Onsite Training request form to receive a proposal.