Date: September 25, 2018
Time: 1:00 p.m.-5:00 p.m. EDT
Cost: $200
This AVS Webinar on Recent Developments in Focused Ion Beam Technology is an  introduction to focused ion beam instrumentation and basic ion-solid interaction theory. Ion-specimen interactions will be used to describe methods of specimen preparation for SEM, TEM, AFM, Auger, SIMS, and atom probe. Other topics include 2D and 3D FIB-SEM analytical characterization, milling/deposition techniques for nanotechnology, and advances in instrumentation and automation.

Who Should Attend

Students, scientists, engineers and technicians who use or plan to use FIB instruments

Other AVS Events

October 21-26, 2018, Long Beach, California



(i)   Introduction to Focused Ion Beam Instrumentation
(ii)  Ion-Solid interactions, ion imaging,  and ion implantation
(iii) Deposition and nanoprototyping
(iv) 2D and 3D speciment preparation
(v)  S/TEM and APT specimen preparation