Overview

Date: September 25, 2018
Time: 1:00 p.m.-5:00 p.m. EDT
Cost: $200
This AVS Webinar on Recent Developments in Focused Ion Beam Technology is an  introduction to focused ion beam instrumentation and basic ion-solid interaction theory. Ion-specimen interactions will be used to describe methods of specimen preparation for SEM, TEM, AFM, Auger, SIMS, and atom probe. Other topics include 2D and 3D FIB-SEM analytical characterization, milling/deposition techniques for nanotechnology, and advances in instrumentation and automation.

Who Should Attend

Students, scientists, engineers and technicians who use or plan to FIB instruments

Other AVS Events

 
October 21-26, 2018, Long Beach, California

Presenter

Syllabus

(i)   Introduction to Focused Ion Beam Instrumentation
 
(ii)  Ion-Solid interactions, ion imaging,  and ion implantation
 
(iii) Deposition and nanoprototyping
 
(iv) 2D and 3D speciment preparation
 
(v)  S/TEM and APT specimen preparation