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BEGIN:VEVENT
UID:5df012b443551468e88e274cd10d3e16cd383e31@swoogo.com
DTSTAMP:20260912T162244Z
DESCRIPTION:CONFERENCE WEBSITE: http://www2.avs.org/conferences/FCMN/regist
 ration.htm [https://miomd2018.avs.org/] \n  \nThe 2019 International Confe
 rence on Frontiers of Characterization and Metrology for Nanoelectronics (
 FCMN) will be held at the Monterey Marriott in Monterey\, CA\, April 2-4\,
  2019. \n\nThe FCMN will bring together scientists and engineers intereste
 d in all aspects of the characterization technology needed for nanoelectro
 nic materials and device research\, development\, and manufacturing. All a
 pproaches are welcome: chemical\, physical\, electrical\, magnetic\, optic
 al\, in-situ\, and real-time control and monitoring. The conference will s
 ummarize major issues and provided critical reviews of important semicondu
 ctor techniques needed as the semiconductor industry moves to silicon nano
 electronics and beyond.\n\nThe conference consists of formal invited prese
 ntation sessions and poster sessions for contributed papers. The poster pa
 pers cover new developments in characterization and metrology especially a
 t the nanoscale. The conference series began 1995 and is the 12th conferen
 ce in the series.\n\nCONFERENCE VENUE: \nMonterey Marriott Hotel \n350 Cal
 le Principal \nMonterey\, CA 93940
DTSTART:20190402T140000Z
DTEND:20190405T000000Z
LAST-MODIFIED:20260912T162244Z
LOCATION:Monterey Marriott Hotel\, 350 Calle Principal\, Monterey\, CA 9394
 0\, United States
SEQUENCE:0
STATUS:CONFIRMED
SUMMARY:(FCMN 2019) International Conference on Frontiers of Characterizati
 on and Metrology for Nanoelectronics
TRANSP:OPAQUE
X-ALT-DESC;FMTTYPE=text/html:<div><span style='font-size:14px\;'><strong>Co
 nference Website</strong>: <a href='https://miomd2018.avs.org/' target='_b
 lank'>http://www2.avs.org/conferences/FCMN/registration.htm</a></span></di
 v>\n\n<div> </div>\n\n<div><span style='font-size:14px\;'><span style='col
 or:rgb(64\,64\,64)\;font-family:Arial\, Helvetica\, Verdana\, sans-serif\;
 '>The 2019 International Conference on Frontiers of Characterization and M
 etrology for Nanoelectronics (FCMN) will be held at the Monterey Marriott 
 in Monterey\, CA\, April 2-4\, 2019.</span></span></div>\n\n<div>\n<p><spa
 n style='font-size:14px\;'><span style='line-height:14.95px\;'><span style
 ='font-family:Arial\, Helvetica\, Verdana\, sans-serif\;'><span style='col
 or:#404040\;'><span style='font-style:normal\;'><span><span><span style='f
 ont-weight:400\;'><span style='letter-spacing:normal\;'><span><span style=
 'text-transform:none\;'><span style='white-space:normal\;'><span><span sty
 le='word-spacing:0px\;'><span style='background-color:#ffffff\;'><span><sp
 an>The FCMN will bring together scientists and engineers interested in all
  aspects of the characterization technology needed for nanoelectronic mate
 rials and device research\, development\, and manufacturing. All approache
 s are welcome: chemical\, physical\, electrical\, magnetic\, optical\, in-
 situ\, and real-time control and monitoring. The conference will summarize
  major issues and provided critical reviews of important semiconductor tec
 hniques needed as the semiconductor industry moves to silicon nanoelectron
 ics and beyond.<br /><br />\nThe conference consists of formal invited pre
 sentation sessions and poster sessions for contributed papers. The poster 
 papers cover new developments in characterization and metrology especially
  at the nanoscale. The conference series began 1995 and is the 12th confer
 ence in the series.</span></span></span></span></span></span></span></span
 ></span></span></span></span></span></span></span></span></span></p>\n\n<d
 iv><strong><span style='font-size:14px\;'>Conference Venue:</span></strong
 ></div>\n\n<div><span style='font-size:14px\;'>Monterey Marriott Hotel</sp
 an></div>\n\n<div><span style='font-size:14px\;'>350 Calle Principal</span
 ></div>\n\n<div><span style='font-size:14px\;'>Monterey\, CA 93940</span><
 /div>\n</div>
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ACTION:DISPLAY
DESCRIPTION:CONFERENCE WEBSITE: http://www2.avs.org/conferences/FCMN/regist
 ration.htm [https://miomd2018.avs.org/] \n  \nThe 2019 International Confe
 rence on Frontiers of Characterization and Metrology for Nanoelectronics (
 FCMN) will be held at the Monterey Marriott in Monterey\, CA\, April 2-4\,
  2019. \n\nThe FCMN will bring together scientists and engineers intereste
 d in all aspects of the characterization technology needed for nanoelectro
 nic materials and device research\, development\, and manufacturing. All a
 pproaches are welcome: chemical\, physical\, electrical\, magnetic\, optic
 al\, in-situ\, and real-time control and monitoring. The conference will s
 ummarize major issues and provided critical reviews of important semicondu
 ctor techniques needed as the semiconductor industry moves to silicon nano
 electronics and beyond.\n\nThe conference consists of formal invited prese
 ntation sessions and poster sessions for contributed papers. The poster pa
 pers cover new developments in characterization and metrology especially a
 t the nanoscale. The conference series began 1995 and is the 12th conferen
 ce in the series.\n\nCONFERENCE VENUE: \nMonterey Marriott Hotel \n350 Cal
 le Principal \nMonterey\, CA 93940
TRIGGER:-PT15M
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